US PATENT SUBCLASS 356 / 355
.~.~ For dimensional measurement (e.g., thickness)

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345  DF  BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
354  DF  .~ With wavefront division (e.g., by diffraction) {1}
355.~.~ For dimensional measurement (e.g., thickness) {1}
356  DF  .~.~.~> Of displacement or distance

DEFINITION

Classification: 356/355

For dimensional measurement (e.g., thickness):

(under subclass 354) Subject matter wherein light interference is examined to determine the height, width, depth, or change in position of an object.

(1) Note. Subject matter of this subclass 355 usually is directed toward mensuration of tangible substances, or very

small specs between objects.

SEE OR SEARCH THIS CLASS, SUBCLASS:

3+, for range or remote distance measurement.

357+, for light interference mensuration without wavefront division.

372+, for optical mensuration, per se.