US PATENT SUBCLASS 356 / 363
.~ For orientation and alignment

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345  DF  BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
363.~ For orientation and alignment

DEFINITION

Classification: 356/363

For orientation and alignment:

(under subclass 345) Subject matter including means for determining the alignment or orientation of a surface relative to a reference line or plane.

SEE OR SEARCH THIS CLASS, SUBCLASS:

138+, for axial or angular alignment by optical measuring and testing.

375, for determination of position with respect to a reference.

399+, for alignment in a lateral direction by optical measuring and testing.