US PATENT SUBCLASS 356 / 141.3
.~.~.~ With unidirectional or planar source beam directed at the photodetecting station

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
140  DF  .~ Apex of angle at observing or detecting station {6}
141.2  DF  .~.~ With photodetection {3}
141.3.~.~.~ With unidirectional or planar source beam directed at the photodetecting station

DEFINITION

Classification: 356/141.3

With unidirectional or planar source beam directed at the photodetecting station:

(under subclass 141.2) Subject matter that includes a unidirectional beam source or a directed plane light source that is remotely located with respect to the observing or detecting station.

(1) Note. The plane of light may be generated by a scanned beam.