US PATENT SUBCLASS 356 / 255
.~.~ By reflection


Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

247  DF  FIDUCIAL INSTRUMENTS {3}
253  DF  .~ Deflection of line of sight {2}
255.~.~ By reflection


DEFINITION

Classification: 356/255

(under subclass 253) Subject matter where the line of sight is deflected by reflection.

SEE OR SEARCH CLASS

359, Optics: Systems (Including Communication) and Elements,

838+, for reflectors in general.