US PATENT SUBCLASS 356 / 300
BY DISPERSED LIGHT SPECTROSCOPY

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


356 /   HD   OPTICS: MEASURING AND TESTING

300BY DISPERSED LIGHT SPECTROSCOPY {10}
301  DF  .~> With Raman type light scattering
302  DF  .~> For spectrographic (i.e., photographic) investigation {3}
306  DF  .~> With internal standard comparison
307  DF  .~> With background radiation comparison
308  DF  .~> With synchronized spectrum repetitive scanning (e.g., cathode-ray readout) {1}
310  DF  .~> With aperture mask
311  DF  .~> With sample excitation (e.g., burning) {5}
319  DF  .~> Utilizing a spectrophotometer (i.e., plural beam) {3}
326  DF  .~> Utilizing a spectrometer {3}
331  DF  .~> With monochromator structure {1}

DEFINITION

Classification: 356/300

BY DISPERSED LIGHT SPECTROSCOPY:

(under the class definition) Subject matter for the

examination of a dispersed beam of light or selected portions thereof as by a prism or diffraction grating from a narrow beam of light as from a slit, or for utilizing a portion of a dispersed beam, such as from a monochromator, for examination of substances by transmitting light through or reflecting light from the substances or for the examination of the dispersed beam from a stimulated light emissive sample.

(1) Note. Included in this subclass are spectroscopes.

(2) Note. The line between Class 250, Radiant Energy, and the spectroscopic examination found in this class is: Claims to a spectroscopic arrangement which include only the examination of visible radiation will be found in subclasses 300+; claims to a spectroscopic arrangement which include optical limitations which are usable in the infrared, ultraviolet, and visible light range will be found in subclass 51 in this class providing no significant nonvisible radiation or examining structure is involved in the claims; claims to a spectroscopic arrangement including a source of invisible radiation such as infrared or ultraviolet, or a particular material operative for the purposes of the disclosure only in the invisible radiation range, or a detector responsive only to invisible radiation will be classified in Class 250.

(3) Note. The line between Class 345, Computer Graphics Processing, Operator Interface Processing, and Selective Visual Display Systems, and Class 356 with respect to spectroscopy and with respect to the remaining portions of Class 356 is: where a Class 356 device is claimed in combination with a recorder of the Class 346 type, Class 356 will take combinations including a broad optical test for Class 356 combined with a broad Class 346 recorder. However, a name only optical test device in combination with a specific recorder will be classified in Class 346. Any details of the optical test device whether patentable or not with a specific recorder will be classified in Class 356.

(4) Note. Diffraction crystals used to disperse X radiation when used with the combination of elements forming a spectrometer or spectropscope will not be classified here. See Class 378, X-Ray or Gamma Ray Systems or Devices, subclass 70.

SEE OR SEARCH THIS CLASS, SUBCLASS:

402+, for filter photometers which analyze the wave length and the intensity of emitted light or the light of specific wave lengths absorbed by materials as a result of reflective or transmissive tests, where filters rather than dispersing mediums are used to isolate various wave lengths of light. SEE OR SEARCH CLASS

250, Radiant Energy,

200+, for photocell circuits which do not involve the measurement of light or the testing of material by means of visible light; subclasses 336.1+ for methods and apparatus involving emission or absorption infrared or ultraviolet spectrometers.

359, Optics: Systems (Including Communication) and Elements,

558+, for diffraction gratings and mounts; subclass 615 for light dispersion systems which do not involve the analysis of the dispersed light; subclasses 831+ for prisms and mountings for the prisms; subclasses 362+ for compound lens systems; subclasses 811+ for lenses and their supports; and subclasses 894+ for optical apertures including slits.

378, X-Ray or Gamma Ray Systems or Devices,

70+, for X-ray diffraction analysis.

399, Electrophotography,

9+, for diagnostics of electrophotos:graphic devices, particularly subclasses 31+ for image-forming components.