US PATENT SUBCLASS 356 / 953
.~ Probe photometers (GO1N 21/85B)

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356 /   HD   OPTICS: MEASURING AND TESTING

928  DD  INVESTIGATING OR ANALYZING MATERIALS BY THE USE OF OPTICAL MEANS, I.E., USING INFRA-RED, VISIBLE, OR ULTRA-VIOLET LIGHT (GO1N 21/00) {5}
953.~ Probe photometers (GO1N 21/85B)