US PATENT SUBCLASS 356 / 910
.~ By means of diode-array scanning (GO1B 11/02C)
Current as of:
June, 1999
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356 /
HD
OPTICS: MEASURING AND TESTING
908
DD
MEASURING LENGTH, WIDTH, OR THICKNESS (GO1B 11/02)
{2}
910
.~ By means of diode-array scanning (GO1B 11/02C)
