US PATENT SUBCLASS 356 / 139.02
.~.~ With reticle or slot

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
139.01  DF  .~ Star/Sun/Satellite position indication with photodetection {1}
139.02.~.~ With reticle or slot

DEFINITION

Classification: 356/139.02

With reticle or slot:

(under subclass 139.01) Subject matter including a reticle or aperture slot in an optical path of the photodetector that enables the determination of the angle.