US PATENT SUBCLASS 356 / 238.3-- .~.~ Detection of foreign material (e.g., trash, splinters, contaminants, etc.)

US PATENT SUBCLASS 356 / 238.3
.~.~ Detection of foreign material (e.g., trash, splinters, contaminants, etc.)

Current as of: June, 1999
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356 /	HD	OPTICS: MEASURING AND TESTING

237.1	DF	INSPECTION OF FLAWS OR IMPURITIES {6}
238.1	DF	.~ Textile inspection {2}
238.3		.~.~ Detection of foreign material (e.g., trash, splinters, contaminants, etc.)

DEFINITION

Classification: 356/238.3

Detection of foreign material (e.g., trash, splinters, contaminants, etc.):

(under subclass 238.1) Textile inspection designed specifically to detect the presence or absence of an uncharacteristic substance on or within the specimen.

(3) Note. This subclass provides generally for detection of localized foreign particles or dirt.

SEE OR SEARCH THIS CLASS, SUBCLASS:

239.5, for the detection of an object on or in a transparent or translucent container.

239.8, for the detection of foreign matter on the surface of a transparent or translucent article

432+, for the testing of materials where the particles are uniformly distributed through the material.

SEE OR SEARCH CLASS 250, Radiant Energy,

559.41, for a photocell with associated circuitry capable of identifying the presence of a foreign substance on or embedded in a material from variations in a detected light signal.