US PATENT SUBCLASS 356 / 141.5
.~.~.~ With at least 2-dimensional sensitivity

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
140  DF  .~ Apex of angle at observing or detecting station {6}
141.2  DF  .~.~ With photodetection {3}
141.5.~.~.~ With at least 2-dimensional sensitivity

DEFINITION

Classification: 356/141.5

With at least 2-dimensional sensitivity:

(under subclass 141.3) Subject matter that specifically includes means for measuring at least two spatial coordinates (e.g., x and y coordinates or azimuth and elevation).

SEE OR SEARCH THIS CLASS, SUBCLASS:

139.01, for measuring and indicating angle (e.g., declination and hour angle to the sun, stars, or other astronomical objects).

139.03, for measuring and indicating yaw, pitch, and roll relative to an arbitrarily chosen axis or to geophysical planes.