US PATENT SUBCLASS 356 / 141.4
.~.~.~ With optical scanning of light beam or detector

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
140  DF  .~ Apex of angle at observing or detecting station {6}
141.2  DF  .~.~ With photodetection {3}
141.4.~.~.~ With optical scanning of light beam or detector

DEFINITION

Classification: 356/141.4

With optical scanning of light beam or detector:

(under subclass 141.2) Subject matter that includes means for continuously optically moving the photodetecting station

field of view to enable the determination and indication of angle apex at the detecting station.

(1) Note. Subject matter in this subclass does not define a scanning at the source of light.