US PATENT SUBCLASS 356 / 446
.~ With diffusion


Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

445  DF  OF LIGHT REFLECTION (E.G., GLASS) {3}
446.~ With diffusion


DEFINITION

Classification: 356/446

With diffusion:

(under subclass 445) Subject matter wherein the light reflected from the material or sample is scattered by reason of the surface irregularities of the material or sample alone; or wherein the reflected light is a combination of the scattered light and specularly reflected light; or wherein the reflected light is scattered from particles distributed on the surface of the material.

SEE OR SEARCH THIS CLASS, SUBCLASS:

237.1+, for inspection of material or articles for flaws which include the detection of contaminants such as dirt within a bottled fluid.

337+, for light scattering caused by more or less uniformly distributed particles internally in a fluid, liquid, or gas which may be moving or static.

427, for light scattering caused by contaminants, such as dirt or other particles, which are entrained in encapsulated or bottled fluids, where agitation or rotation is used to cause the unwanted particles to move about within the fluid.

448, for comparison apparatus of the reflected light type which does not involve light diffusion.