US PATENT SUBCLASS 356 / 336
.~ By particle light scattering

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

335  DF  FOR SIZE OF PARTICLES {1}
336.~ By particle light scattering

DEFINITION

Classification: 356/336

By particle light scattering:

(under subclass 335) Subject matter to visually or photoelectrically inspect or measure the scattering of light by particles or molecules entrained in a static or flowing

medium.