US PATENT SUBCLASS 356 / 28.5
.~.~ Of light interference (e.g., interferometer)

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

27  DF  VELOCITY OR VELOCITY/HEIGHT MEASURING {1}
28  DF  .~ With light detector (e.g., photocell) {1}
28.5.~.~ Of light interference (e.g., interferometer)

DEFINITION

Classification: 356/28.5

Of light interference (e.g., interferometer):

(under subclass 28) Subject matter wherein the detection means is responsive to an interference pattern formed by the interaction of coherent light waves.

(1) Note. This subclass includes heterodyne interferometers which measure a doppler-shifted beam reflected from a moving object.

SEE OR SEARCH THIS CLASS, SUBCLASS:

4.09, and 4.1, for light interference measurement of displacement or distance over large distances.

35.5, for material strain analysis by light interference measurement.

345+, for light interference measuring and testing, per se.

SEE OR SEARCH CLASS

73, Measuring and Testing, 71.3, for vibration sensing with a light beam indicator.