US PATENT SUBCLASS 356 / 147
.~.~ Measurement in two planes (e.g., azimuth and elevation; hour angle and declination)

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
140  DF  .~ Apex of angle at observing or detecting station {6}
147.~.~ Measurement in two planes (e.g., azimuth and elevation; hour angle and declination)

DEFINITION

Classification: 356/147

(under subclass 140) Subject matter where angles are measured in two different planes.