US PATENT SUBCLASS 356 / 152.3
.~.~ With reflection of a unidirectional source beam from a retroreflector


Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
152.1  DF  .~ With photodetection remote from measured angle {2}
152.3.~.~ With reflection of a unidirectional source beam from a retroreflector


DEFINITION

Classification: 356/152.3

With reflection of a unidirectional source beam from a

retroreflector:

(under subclass 152.1) Subject matter including a reflective surface at a remote object from which a source beam directed along one axis reflects back to a source and photodetecting station colinearly or in parallel with respect to the source direction.

SEE OR SEARCH THIS CLASS, SUBCLASS:

139.03, for attitude in yaw, pitch, and roll of either a remote planar reflector or the detecting station.

139.07+, for the same plus automatic following or aligning while indicating the angle or misalignment.

141.1, for apex of angle strictly at the detecting station and where there is no automatic following or alignment.