US PATENT SUBCLASS 356 / 237.2
.~ Surface condition

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

237.1  DF  INSPECTION OF FLAWS OR IMPURITIES {6}
237.2.~ Surface condition {2}
237.3  DF  .~.~> Detection of object or particle on surface {1}
237.5  DF  .~.~> On patterned or topographical surface (e.g., wafer, mask, circuit board)

DEFINITION

Classification: 356/237.2

Surface condition:

(under subclass 237.1) Inspection of imperfections or impurities wherein the exterior or interior veneer of an article is examined.

SEE OR SEARCH THIS CLASS, SUBCLASS:

239.7, for the inspection of the surface condition of a transparent or translucent specimen.

243.4, for surface condition standards.

SEE OR SEARCH CLASS

250, Radiant Energy,

559.4+, for circuitry responsive to a photocell, and wherein the photocell is arranged relative to the material so that the circuit provides an output indicating the presence or absence of the material or some indicia on the material in some predefined location.