US PATENT SUBCLASS 356 / 35.5
.~ By light interference detector (e.g., interferometer)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


356 /   HD   OPTICS: MEASURING AND TESTING

32  DF  MATERIAL STRAIN ANALYSIS {2}
35.5.~ By light interference detector (e.g., interferometer)

DEFINITION

Classification: 356/35.5

By light interference detector (e.g., inter-ferometer):

(under subclass 32) Subject matter including means responsive to an interference pattern produced by the interaction of coherent light waves with the stressed article or material.

SEE OR SEARCH THIS CLASS, SUBCLASS:

4.5, for light interference measurement of displacement or distance over large distances.

28.5, for light interference measurement of velocity.

345+, for light interference measurement, per se.