US PATENT SUBCLASS 356 / 32
MATERIAL STRAIN ANALYSIS


Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

32MATERIAL STRAIN ANALYSIS {2}
33  DF  .~> With polarized light {2}
35.5  DF  .~> By light interference detector (e.g., interferometer)


DEFINITION

Classification: 356/32

(under the class definition) Subject matter for examining an article or material by noting the effect of the strain in the stressed article on light associated with the article or material.

(1) Note. The light may be passed through or reflected from the article or material, or may be modified by changes in the contour or the position of markings thereon. The modification of the light may be in intensity, direction, polarization, color, or interference patterns produced thereby.

(2) Note. Stress strain measuring generally is provided for elsewhere (see the Search Class notes below). However, where the changes in the material tested operate to modify the characteristics of the light associated with the test, absent intentional loading of the specimen, classification is in this Class 356.

SEE OR SEARCH CLASS

33, Geometrical Instruments,

125, for extensiometers. See the (2) note of this subclass. 73, Measuring and Testing,

763+, for testing the stress or strain of material, particularly subclass 800 for optical stress analysis with intentional loading of the specimen, and subclasses 862+ for dynamometers which are not provided for elsewhere and which do not involve the modification of the associated light. See also (2) Note above.