US PATENT SUBCLASS 356 / 33
.~ With polarized light


Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

32  DF  MATERIAL STRAIN ANALYSIS {2}
33.~ With polarized light {2}
34  DF  .~.~> Attached detector
35  DF  .~.~> Sheet material


DEFINITION

Classification: 356/33

(under subclass 32) Subject matter wherein the light utilized in the examination or analysis is polarized light, or is polarized as a result of the examination or analysis.

(1) Note. Class 359, subclasses 240+ and 483 provides for polarizing structure generally whose light polarizing properties are modified by mechanical stress; while the subject matter of this subclass is restricted to the measuring or analyzing of the strain in the stressed article or material from the effect of the strain on polarized light or from the polarizing effect of light.

(2) Note. This Class 356 provides for stress-strain determinations in articles or materials where the light is directly or indirectly associated with the article or material stressed as by direct reflection from or transmission through the articles or materials, and for transmissions of the light through detectors attached to articles or materials which are naturally or forced by stress to be light birefringent as a result of the strain on the articles or materials; while Class 73, subclasses 760+, provides for stress-strain determinations generally.

SEE OR SEARCH THIS CLASS, SUBCLASS:

30, for crystal or gem examination wherein polarized light testing may be involved.

SEE OR SEARCH CLASS 73, Measuring and Testing,

133, and 763+ for stress-strain testing apparatus and dynamometers generally where no polarized light is involved. See also (2) Note above.