US PATENT SUBCLASS 356 / 152.2
.~.~ With reflection of a unidirectional source beam from a planar or nonretroreflective surface

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
152.1  DF  .~ With photodetection remote from measured angle {2}
152.2.~.~ With reflection of a unidirectional source beam from a planar or nonretroreflective surface

DEFINITION

Classification: 356/152.2

With reflection of a unidirectional source beam from a planar or nonretroreflective surface:

(under subclass 152.1) Subject matter including a planar, spherical, etc., reflecting surface at a remote object from which a source beam directed along one axis will reflect at different angles to be measured along at least one plane.

SEE OR SEARCH THIS CLASS, SUBCLASS:

139.03, for attitude in yaw, pitch, and roll of either a remote planar reflector or the detecting station.

139.07+, for the same plus automatic following or aligning while indicating the angle or misalignment.

141.1, for apex of angles strictly at the detecting station and where there is no automatic following or alignment.