US PATENT SUBCLASS 356 / 139.07
.~.~ With photodetection of reflected beam angle with respect to a unidirectional source beam

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
139.04  DF  .~ Automatic following or aligning while indicating measurement {3}
139.07.~.~ With photodetection of reflected beam angle with respect to a unidirectional source beam {1}
139.08  DF  .~.~.~> With source beam moving to follow or align

DEFINITION

Classification: 356/139.07

With photodetection of reflected beam angle with respect to a unidirectional source beam:

(under subclass 139.04) Subject matter including a source beam directed along one axis to the object from which its reflected direction, with respect to its projected direction, is indicated and either followed or aligned.

(1) Note. This subclass may include devices where the reflection plane or the detector apparatus is servoed to follow or align the reflected beam from a fixed source to the detector.

SEE OR SEARCH THIS CLASS, SUBCLASS:

141.1, for measurement of the apex of the angle made at the detecting station without means to follow or align the received or transmitted beam on the object.

152.2+, for measurement of a remote apex angle without means to follow or align the received or transmitted beam on the object.