US PATENT SUBCLASS 356 / 7
.~ Periscope or offset type

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

3  DF  RANGE OR REMOTE DISTANCE FINDING {9}
7.~ Periscope or offset type

DEFINITION

Classification: 356/7

(under subclass 3) Subject matter wherein the instrument has two axis which are offset from each other in a direction perpendicular to the base line so that the device may function as a periscope.

SEE OR SEARCH CLASS

359, Optics: Systems (Including Communication) and Elements,

540+, for periscopes, per se.