US PATENT SUBCLASS 356 / 3.07
.~.~.~.~ Having electronic scanning of the photodetector

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

3  DF  RANGE OR REMOTE DISTANCE FINDING {9}
3.01  DF  .~ Triangulation ranging to a point with one projected beam {3}
3.03  DF  .~.~ Using a source beam with a fixed axial direction or plane {3}
3.06  DF  .~.~.~ With a single photodetector having multiple elements {1}
3.07.~.~.~.~ Having electronic scanning of the photodetector

DEFINITION

Classification: 356/3.07

Having electronic scanning of the photodetector:

(under subclass 3.06) Subject matter that includes electronic regular sampling through time of the elements of the detector array in order to determine the position or angle associated with a particular element illuminated by the target.

(1) Note. This subclass includes, for example, CCD-type detectors.

SEE OR SEARCH THIS CLASS, SUBCLASS:

3.03, for vidicon-type detection.