US PATENT SUBCLASS 356 / 142
.~.~ Scale and remote point simultaneously observable

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

138  DF  ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT {11}
140  DF  .~ Apex of angle at observing or detecting station {6}
142.~.~ Scale and remote point simultaneously observable {1}
143  DF  .~.~.~> Artificial reference

DEFINITION

Classification: 356/142

(under subclass 140) Subject matter including means whereby the angle measuring scale and the remote target point are simultaneously observable.

SEE OR SEARCH THIS CLASS, SUBCLASS:

139, for means for simultaneously observing plural scales or different portions of the same scale.