US PATENT SUBCLASS 356 / 339
.~.~ At right angles to the light beam (e.g., nephelometer)

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

337  DF  BY PARTICLE LIGHT SCATTERING {1}
338  DF  .~ With photocell detection {5}
339.~.~ At right angles to the light beam (e.g., nephelometer)

DEFINITION

Classification: 356/339

At right angles to the light beam (e.g., nephelometer):

(under subclass 338) Subject matter wherein the photosensitive means detects light scattered at an angle of substantially 90 deg. to the incident light beam.