US PATENT SUBCLASS 356 / 954-- .~ Scan or image signal processing arrangements specially adapted for investigating the presence of flaws or contaminates, e.g., for scan signal adjustments, for detecting different kinds of defects, for compensating for structures (GO1N 21/88)

US PATENT SUBCLASS 356 / 954
.~ Scan or image signal processing arrangements specially adapted for investigating the presence of flaws or contaminates, e.g., for scan signal adjustments, for detecting different kinds of defects, for compensating for structures (GO1N 21/88)

356 /	HD	OPTICS: MEASURING AND TESTING

928	DD	INVESTIGATING OR ANALYZING MATERIALS BY THE USE OF OPTICAL MEANS, I.E., USING INFRA-RED, VISIBLE, OR ULTRA-VIOLET LIGHT (GO1N 21/00) {5}
954		.~ Scan or image signal processing arrangements specially adapted for investigating the presence of flaws or contaminates, e.g., for scan signal adjustments, for detecting different kinds of defects, for compensating for structures (GO1N 21/88)