US Patent Class 714
ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY




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Current as of: June, 1999
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  DF  CLASS NOTES
1  DF  RELIABILITY AND AVAILABILITY
2  DF  .~ Fault recovery
3  DF  .~.~ By masking or reconfiguration
4  DF  .~.~.~ Of network
5  DF  .~.~.~ Of memory or peripheral subsystem
6  DF  .~.~.~.~ Redundant stored data accessed (e.g., duplicated data, error correction coded data, or other parity-type data)
7  DF  .~.~.~.~.~ Reconfiguration (e.g., adding a replacement storage component)
8  DF  .~.~.~.~ Isolating failed storage location (e.g., sector remapping)
9  DF  .~.~.~.~ Access processor affected (e.g., I/O processor, MMU, DMA processor)
10  DF  .~.~.~ Of processor
11  DF  .~.~.~.~ Concurrent, redundantly operating processors
12  DF  .~.~.~.~.~ Synchronization maintenance of processors
13  DF  .~.~.~.~ Prepared backup processor (e.g., initializing cold backup) or updating backup processor (e.g., by checkpoint message)
14  DF  .~.~.~ Of power supply
15  DF  .~.~ State recovery (i.e., process or data file)
16  DF  .~.~.~ Forward recovery (e.g., redoing committed action)
17  DF  .~.~.~.~ Reexecuting single instruction or bus cycle
18  DF  .~.~.~ Transmission data record (e.g., for retransmission)
19  DF  .~.~.~ Undo record
20  DF  .~.~.~ Plural recovery data sets containing set interrelation data (e.g., time values or log record numbers)
21  DF  .~.~.~ State validity check
22  DF  .~.~.~ With power supply status monitoring
23  DF  .~.~ Resetting processor
24  DF  .~.~ Safe shutdown
25  DF  .~ Fault locating (i.e., diagnosis or testing)
26  DF  .~.~ Artificial intelligence (e.g., diagnostic expert system)
27  DF  .~.~ Particular access structure
28  DF  .~.~.~ Substituted emulative component (e.g., emulator microprocessor)
29  DF  .~.~.~.~ Memory emulator feature
30  DF  .~.~.~ Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path)
31  DF  .~.~.~ Additional processor for in-system fault locating (e.g., distributed diagnosis program)
32  DF  .~.~ Particular stimulus creation
33  DF  .~.~.~ Derived from analysis (e.g., of a specification or by stimulation)
34  DF  .~.~.~ Halt, clock, or interrupt signal (e.g., freezing, hardware breakpoint, single-stepping)
35  DF  .~.~.~ Substituted or added instruction (e.g., code instrumenting, breakpoint instruction)
36  DF  .~.~.~ Test sequence at power-up or initialization
37  DF  .~.~ Analysis (e.g., of output, state, or design)
38  DF  .~.~.~ Of computer software
39  DF  .~.~.~ Monitor recognizes sequence of events (e.g., protocol or logic state analyzer)
40  DF  .~.~ Component dependent technique
41  DF  .~.~.~ For reliability enhancing component (e.g., testing backup spare, or fault injection)
42  DF  .~.~.~ Memory or storage device component fault
43  DF  .~.~.~ Bus, I/O channel, or network path component fault
44  DF  .~.~.~ Peripheral device component fault
45  DF  .~.~ Output recording (e.g., signature or trace)
46  DF  .~.~ Operator interface for diagnosing or testing
47  DF  .~ Performance monitoring for fault avoidance
48  DF  .~ Error detection or notification
49  DF  .~.~ State error (i.e., content of instruction, data, or message)
50  DF  .~.~.~ State out of sequence
51  DF  .~.~.~.~ Control flow state sequence monitored (e.g., watchdog processor for control-flow checking)
52  DF  .~.~.~.~ Error checking code
53  DF  .~.~.~ Address error
54  DF  .~.~.~ Storage content error
55  DF  .~.~ Timing error (e.g., watchdog timer time-out)
56  DF  .~.~.~ Bus or I/O channel device fault
57  DF  .~.~ Error forwarding and presentation (e.g., operator console, error display)
700  DF  SKEW DETECTION/CORRECTION
701  DF  DATA FORMATTING TO IMPROVE ERROR DETECTION/CORRECTION CAPABILITY
702  DF  .~ Memory access (e.g., address permutation)
703  DF  TESTING OF ERROR-CHECK SYSTEM
704  DF  ERROR COUNT OR RATE
705  DF  .~ Pseudo-error rate
706  DF  .~ Up-down counter
707  DF  .~ Synchronization control
708  DF  .~ Shutdown or establishing system parameter (e.g., transmission rate)
709  DF  DATA PULSE EVALUATION/BIT DECISION
710  DF  REPLACEMENT OF MEMORY SPARE LOCATION, PORTION, OR SEGMENT
711  DF  .~ Spare row or column
712  DF  TRANSMISSION FACILITY TESTING
713  DF  .~ For channel having repeater
714  DF  .~ By tone signal
715  DF  .~ Test pattern with comparison
716  DF  .~.~ Loop-back
717  DF  .~ Loop or ring configuration
718  DF  MEMORY TESTING
719  DF  .~ Read-in with read-out and compare
720  DF  .~.~ Special test pattern (e.g., checkerboard, walking ones)
721  DF  .~ Electrical parameter (e.g., threshold voltage)
722  DF  .~ Performing arithmetic function on memory contents
723  DF  .~ Error mapping or logging
724  DF  DIGITAL LOGIC TESTING
725  DF  .~ Programmable logic array (PLA) testing
726  DF  .~ Scan path testing (e.g., level sensitive scan design (LSSD))
727  DF  .~.~ Boundary scan
728  DF  .~.~ Random pattern generation (includes pseudorandom pattern)
729  DF  .~.~ Plural scan paths
730  DF  .~.~ Addressing
731  DF  .~.~ Clock or synchronization
732  DF  .~ Signature analysis
733  DF  .~ Built-in testing circuit (BILBO)
734  DF  .~ Structural (in-circuit test)
735  DF  .~ Device response compared to input pattern
736  DF  .~ Device response compared to expected fault-free response
737  DF  .~ Device response compared to fault dictionary/truth table
738  DF  .~ Including test pattern generator
739  DF  .~.~ Random pattern generation (includes pseudorandom pattern)
740  DF  .~.~ Having analog signal
741  DF  .~.~ Simulation
742  DF  .~.~ Testing specific device
743  DF  .~.~ Addressing
744  DF  .~.~ Clock or synchronization
745  DF  .~ Determination of marginal operation limits
746  DF  DIGITAL DATA ERROR CORRECTION
747  DF  .~ Substitution of previous valid data
748  DF  .~ Request for retransmission
749  DF  .~.~ Retransmission if no ACK returned
750  DF  .~.~ Feedback to transmitter for comparison
751  DF  .~.~ Including forward error correction capability
752  DF  .~ Forward correction by block code
753  DF  .~.~ Double error correcting with single error correcting code
754  DF  .~.~ Error correction during refresh cycle
755  DF  .~.~ Double encoding codes (e.g., product, concatenated)
756  DF  .~.~.~ Cross-interleave Reed-Solomon code (CIRC)
757  DF  .~.~ Parallel generation of check bits
758  DF  .~.~ Error correcting code with additional error detection code (e.g, cyclic redundancy character, parity)
759  DF  .~.~ Look-up table encoding or decoding
760  DF  .~.~ Threshold decoding (e.g., majority logic)
761  DF  .~.~ Random and burst error correction
762  DF  .~.~ Burst error correction
763  DF  .~.~ Memory access
764  DF  .~.~.~ Error correct and restore
765  DF  .~.~.~ Error pointer
766  DF  .~.~.~ Check bits stored in separate area of memory
767  DF  .~.~.~ Code word for plural n-bit (n>1) storage units (e.g., x4 DRAM's)
768  DF  .~.~.~ Error correction code for memory address
769  DF  .~.~.~ Dynamic data storage
770  DF  .~.~.~.~ Disk array
771  DF  .~.~.~.~ Tape
772  DF  .~.~.~ Code word parallel access
773  DF  .~.~.~ Solid state memory
774  DF  .~.~ Adaptive error-correcting capability
775  DF  .~.~ Synchronization
776  DF  .~.~ For packet or frame multiplexed data
777  DF  .~.~ Hamming code
778  DF  .~.~ Nonbinary data (e.g., ternary)
779  DF  .~.~ Variable length data
780  DF  .~.~ Using symbol reliability information (e.g., soft decision)
781  DF  .~.~ Code based on generator polynomial
782  DF  .~.~.~ Bose-Chaudhuri-Hocquenghem code
783  DF  .~.~.~ Golay code
784  DF  .~.~.~ Reed-Solomon code
785  DF  .~.~.~ Syndrome computed
786  DF  .~ Forward error correction by tree code (e.g., convolutional)
787  DF  .~.~ Random and burst errors
788  DF  .~.~ Burst error
789  DF  .~.~ Synchronization
790  DF  .~.~ Puncturing
791  DF  .~.~ Sequential decoder (e.g., Fano or stack algorithm)
792  DF  .~.~.~ Trellis code
793  DF  .~.~ Syndrome decodable (e.g., self orthogonal)
794  DF  .~.~ Maximum likelihood
795  DF  .~.~ Viterbi decoding
796  DF  .~.~ Branch metric calculation
797  DF  .~ Majority decision/voter circuit
798  DF  ERROR DETECTION FOR SYNCHRONIZATION CONTROL
799  DF  ERROR/FAULT DETECTION TECHNIQUE
800  DF  .~ Parity bit
801  DF  .~.~ Parity generator or checker circuit detail
802  DF  .~.~ Even and odd parity
803  DF  .~.~ Parity prediction
804  DF  .~.~ Plural dimension parity check
805  DF  .~.~ Storage accessing (e.g., address parity check)
806  DF  .~ Constant-ratio code (m/n)
807  DF  .~ Check character
808  DF  .~.~ Modulo-n residue check character
809  DF  .~ Code constraint monitored
810  DF  .~.~ Multilevel coding (n>2)
811  DF  .~ Forbidden combination or improper condition
812  DF  .~.~ Specified digital signal or pulse count
813  DF  .~.~ Two key-down detector
814  DF  .~.~ Data timing/clocking
815  DF  .~.~ Time delay/interval monitored
816  DF  .~.~ Two-rail logic
817  DF  .~.~ Noise level
818  DF  .~.~ Missing-bit/drop-out detection
819  DF  .~ Comparison of data
820  DF  .~.~ Plural parallel devices of channels
821  DF  .~.~.~ Transmission facility
822  DF  .~.~ Sequential repetition
823  DF  .~.~.~ True and complement data
824  DF  .~.~ Device output compared to input
825  DF  MISCELLANEOUS
*********************************
FOREIGN ART COLLECTIONS
*********************************
FOR 100  DF  .~ Scan path testing (LSSD) (371/FOR 100)
FOR 101  DF  .~ Including test pattern generator (371/FOR 101)
FOR 102  DF  .~ Block code (371/FOR 102)
FOR 103  DF  .~.~ Memory access (371/FOR 103)
FOR 104  DF  .~ Convolutional code (371/FOR 104)
FOR 105  DF  SKEW DETECTION/CORRECTION (371/1)
FOR 106  DF  DATA FORMATTING TO IMPROVE ERROR DETECTION/CORRECTION CAPABILITY (371/2.1)
FOR 107  DF  .~ Memory access (e.g., address permutation) (371/2.2)
FOR 108  DF  TESTING OF ERROR-CHECK SYSTEM (371/3)
FOR 109  DF  ERROR COUNT OR RATE (371/5.1)
FOR 110  DF  .~ Pseudo-error rate (371/5.2)
FOR 111  DF  .~ Up-down counter (371/5.3)
FOR 112  DF  .~ Synchronization control (371/5.4)
FOR 113  DF  .~ Shutdown or establishing system parameter (e.g., transmission rate) (371/5.5)
FOR 114  DF  DATA PULSE EVALUATION/BIT DECISION (371/6)
FOR 115  DF  REPLACEMENT OF MEMORY SPARE LOCATION, PORTION, OR SEGMENT (371/10.2)
FOR 116  DF  .~ Spare row or column (371/10.3)
FOR 117  DF  TRANSMISSION FACILITY TESTING (371/20.1)
FOR 118  DF  .~ For channel having repeater (371/20.2)
FOR 119  DF  .~ By tone signal (371/20.3)
FOR 120  DF  .~ Test pattern with comparison (371/20.4)
FOR 121  DF  .~.~ Loop-back (371/20.5)
FOR 122  DF  .~ Loop or ring configuration (371/20.6)
FOR 123  DF  MEMORY TESTING (371/21.1)
FOR 124  DF  .~ Read-in with read-out and compare (371/21.2)
FOR 125  DF  .~.~ Special test patterns (e.g., checkerboard, walking ones) (371/21.3)
FOR 126  DF  .~ Electrical parameters (e.g., threshold voltage) (371/21.4)
FOR 127  DF  .~ Performing arithmetic functions on memory contents (371/21.5)
FOR 128  DF  .~ Error mapping or logging (371/21.6)
FOR 129  DF  DIGITAL LOGIC TESTING (371/22.1)
FOR 130  DF  .~ Programmable logic array (PLA) testing (371/22.2)
FOR 131  DF  .~ Scan path testing (e.g., level sensitive scan design (LSSD)) (371/22.31)
FOR 132  DF  .~.~ Boundary scan (371/22.32)
FOR 133  DF  .~.~ Random pattern generation (includes pseudorandom pattern) (371/22.33)
FOR 134  DF  .~.~ Plural scan paths (371/22.34)
FOR 135  DF  .~.~ Addressing (371/22.35)
FOR 136  DF  .~.~ Clock or synchronization (371/22.36)
FOR 137  DF  .~ Signature analysis (371/22.4)
FOR 138  DF  .~ Built-in testing circuit (BILBO) (371/22.5)
FOR 139  DF  .~ Structural (in-circuit test) (371/22.6)
FOR 140  DF  .~ Device response compared to input pattern (371/24)
FOR 141  DF  .~ Device response compared to expected fault-free response (371/25.1)
FOR 142  DF  .~ Device response compared to fault dictionary/truth table (371/26)
FOR 143  DF  .~ Including test pattern generator (371/27.1)
FOR 144  DF  .~.~ Random pattern generation (includes pseudorandom pattern) (371/27.2)
FOR 145  DF  .~.~ Having analog signal (371/27.3)
FOR 146  DF  .~.~ Simulation (371/27.4)
FOR 147  DF  .~.~ Testing specific device (371/27.5)
FOR 148  DF  .~.~ Addressing (371/27.6)
FOR 149  DF  .~.~ Clock or synchronization (371/27.7)
FOR 150  DF  .~ Determination of marginal operation limits (371/28)
FOR 151  DF  DIGITAL DATA ERROR CORRECTION (371/30)
FOR 152  DF  .~ Substitution of previous valid data (371/31)
FOR 153  DF  .~ Request for retransmission (371/32)
FOR 154  DF  .~.~ Retransmission if no ACK returned (371/33)
FOR 155  DF  .~.~ Feedback to transmitter for comparison (371/34)
FOR 156  DF  .~.~ Including forward error correction capability (371/35)
FOR 157  DF  .~ Forward correction by block code (371/37.01)
FOR 158  DF  .~.~ Double error correcting with single error correcting code (371/37.2)
FOR 159  DF  .~.~ Error correction during refresh cycle (371/37.3)
FOR 160  DF  .~.~ Double encoding codes (e.g., product, concatenated) (371/37.4)
FOR 161  DF  .~.~.~ Cross-interleave reed-solomon code (CIRC) (371/37.5)
FOR 162  DF  .~.~ Parallel generation of check bits (371/37.6)
FOR 163  DF  .~.~ Error correcting code with additional error detection code (e.g., cyclic redundancy character, parity (371/37.7)
FOR 164  DF  .~.~ Look-up table encoding or decoding (371/37.8)
FOR 165  DF  .~.~ Threshold decoding (e.g., majority logic) (371/37.9)
FOR 166  DF  .~.~ Random and burst error correction (371/38.1)
FOR 167  DF  .~.~ Burst error correction (371/39.1)
FOR 168  DF  .~.~ Memory access (371/40.11)
FOR 169  DF  .~.~.~ Error correct and restore (371/40.2)
FOR 170  DF  .~.~.~ Error pointer (371/40.3)
FOR 171  DF  .~.~.~ Check bits stored in separable area of memory (371/40.4)
FOR 172  DF  .~.~.~ Code word for plural n-bit (n>1) storage units (e.g., x4 DRAM's) (371/40.12)
FOR 173  DF  .~.~.~ Error correction code for memory address (371/40.13)
FOR 174  DF  .~.~.~ Dynamic data storage (371/40.14)
FOR 175  DF  .~.~.~.~ Disk array (371/40.15)
FOR 176  DF  .~.~.~.~ Tape (371/40.16)
FOR 177  DF  .~.~.~ Code word parallel access (371/40.17)
FOR 178  DF  .~.~.~ Solid state memory (371/40.18)
FOR 179  DF  .~.~ Adaptive error-correcting capability (371/41)
FOR 180  DF  .~.~ Synchronization (371/42)
FOR 181  DF  .~.~ For packet or frame multiplexed data (371/37.02)
FOR 182  DF  .~.~ Hamming code (371/37.03)
FOR 183  DF  .~.~ Nonbinary data (e.g., ternary) (371/37.04)
FOR 184  DF  .~.~ Variable length data (371/37.05)
FOR 185  DF  .~.~ Using symbol reliability information (e.g., soft decision) (371/37.06)
FOR 186  DF  .~.~ Code based on generator polynomial (371/37.07)
FOR 187  DF  .~.~.~ Bose-Chaudhuri-Hocquenghem code (371/37.08)
FOR 188  DF  .~.~.~ Golay code (371/37.09)
FOR 189  DF  .~.~.~ Reed-solomon code (371/37.11)
FOR 190  DF  .~.~.~ Syndrome computed (371/37.12)
FOR 191  DF  .~ Forward error correcton by tree code (e.g., convolutional) (371/43.1)
FOR 192  DF  .~.~ Random and burst errors (371/44)
FOR 193  DF  .~.~ Burst errors (371/45)
FOR 194  DF  .~.~ Synchronization (371/46)
FOR 195  DF  .~.~ Puncturing (371/43.2)
FOR 196  DF  .~.~ Sequential decoder (e.g., Fano or stack algorithm) (371/43.3)
FOR 197  DF  .~.~ Trellis code (371/43.4)
FOR 198  DF  .~.~ Syndrome decodable (e.g., self orthogonal) (371/43.5)
FOR 199  DF  .~.~ Maximum likelihood (371/43.6)
FOR 200  DF  .~.~ Viterbi decoding (371/43.7)
FOR 201  DF  .~.~ Branch metric calculation (371/43.8)
FOR 202  DF  .~ Majority decision/voter circuit (371/36)
FOR 203  DF  ERROR DETECTION FOR SYNCHRONIZATION CONTROL (371/47.1)
FOR 204  DF  ERROR/FAULT DETECTION TECHNIQUES (371/48)
FOR 205  DF  .~ Parity bit (371/49.1)
FOR 206  DF  .~.~ Parity generator or checker circuit detail (371/49.2)
FOR 207  DF  .~.~ Even and odd parity (371/49.3)
FOR 208  DF  .~.~ Parity prediction (371/49.4)
FOR 209  DF  .~.~ Plural dimension parity check (371/50.1)
FOR 210  DF  .~.~ Storage accessing (e.g., address parity check) (371/51.1)
FOR 211  DF  .~ Constant-ratio code (m/n) (371/52)
FOR 212  DF  .~ Check character (371/53)
FOR 213  DF  .~.~ Modulo-n residue check character (371/54)
FOR 214  DF  .~ Code constraint monitored (371/55)
FOR 215  DF  .~.~ Multilevel coding (n>2) (371/56)
FOR 216  DF  .~ Forbidden combination or improper condition (371/57.1)
FOR 217  DF  .~.~ Specified digital signal or pulse count (371/57.2)
FOR 218  DF  .~.~ Two key-down detector (371/59)
FOR 219  DF  .~.~ Data timing/clocking (371/61)
FOR 220  DF  .~.~ Time delay/interval monitored (371/62)
FOR 221  DF  .~.~ Two-rail logic (371/63)
FOR 222  DF  .~.~ Noise level (371/64)
FOR 223  DF  .~.~ Missing-bit/drop-out detection (371/65)
FOR 224  DF  .~ Comparison of data (371/67.1)
FOR 225  DF  .~.~ Plural parallel devices of channels (371/68.1)
FOR 226  DF  .~.~.~ Transmission facility (371/68.2)
FOR 227  DF  .~.~ Sequential repetition (371/69.1)
FOR 228  DF  .~.~.~ True and complement data (371/70)
FOR 229  DF  .~.~ Device output compared to input (371/71)
FOR 230  DF  MISCELLANEOUS (371/72)
FOR 231  DF  RELIABILITY AND AVAILABILITY (395/180)
FOR 232  DF  .~ Fault recovery (395/181)
FOR 233  DF  .~.~ By masking or reconfiguration (395/182.01)
FOR 234  DF  .~.~.~ Of network (395/182.02)
FOR 235  DF  .~.~.~ Of memory or peripheral subsystem (395/182.03)
FOR 236  DF  .~.~.~.~ Redundant stored data accessed (e.g., duplicated data, error correction coded data, or other parity-type data) (395/182.04)
FOR 237  DF  .~.~.~.~.~ With reconfiguration (e.g., adding a replacement storage component) (395/182.05)
FOR 238  DF  .~.~.~.~ Isolating failed storage location (e.g., sector remapping) (395/182.06)
FOR 239  DF  .~.~.~.~ Access processor affected (e.g., I/O processor, MMU, DMA processor) (395/182.07)
FOR 240  DF  .~.~.~ Of processor (395/182.08)
FOR 241  DF  .~.~.~.~ Concurrent, redundantly operating processors (395/182.09)
FOR 242  DF  .~.~.~.~.~ Synchronization maintenance of processors (395/182.1)
FOR 243  DF  .~.~.~.~ Prepared backup processor (e.g., initializing cold backup) or updating backup processor (e.g., by checkpoint processor) (395/182.11)
FOR 244  DF  .~.~.~ Of power supply (395/182.12)
FOR 245  DF  .~.~ State recovery (i.e., process or data file) (395/182.13)
FOR 246  DF  .~.~.~ With forward recovery (e.g., redoing committed action) (395/182.14)
FOR 247  DF  .~.~.~.~ Reexecuting single instruction or bus cycle (395/182.15)
FOR 248  DF  .~.~.~ Transmission data record (e.g., retransmission) (395/182.16)
FOR 249  DF  .~.~.~ Undo records (395/182.17)
FOR 250  DF  .~.~.~ Plural recovery data sets containing set interrelation data (e.g., time values or log record numbers) (395/182.18)
FOR 251  DF  .~.~.~ With state validity check (395/182.19)
FOR 252  DF  .~.~.~ With power supply status monitoring (395/182.2)
FOR 253  DF  .~.~ Resetting processor (395/182.21)
FOR 254  DF  .~.~ Safe shutdown (395/182.22)
FOR 255  DF  .~ Fault locating (i.e., diagnosis or testing) (395/183.01)
FOR 256  DF  .~.~ Artificial intelligence (e.g., diagnostic expert system) (395/183.02)
FOR 257  DF  .~.~ With particular access structure (395/183.03)
FOR 258  DF  .~.~.~ Substituted emulative component (e.g., emulator microprocessor) (395/183.04)
FOR 259  DF  .~.~.~.~ Memory emulator feature (395/183.05)
FOR 260  DF  .~.~.~ Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path) (395/183.06)
FOR 261  DF  .~.~.~ Additional processor for in-system fault locating (e.g., distributed diagnosis program) (395/183.07)
FOR 262  DF  .~.~ With particular stimulus creation (395/183.08)
FOR 263  DF  .~.~.~ Derived from analysis (e.g., of a specification or by simulation) (395/183.09)
FOR 264  DF  .~.~.~ Halt, clock, or interrupt signal (e.g., freezing, hardware breakpoint, single-stepping) (395/183.1)
FOR 265  DF  .~.~.~ Substituted or added instruction (e.g., code instrumenting, breakpoint instruction) (395/183.11)
FOR 266  DF  .~.~.~ Test sequence at power-up or initialization (395/183.12)
FOR 267  DF  .~.~ Analysis (e.g., of output, state, or design) (395/183.13)
FOR 268  DF  .~.~.~ Of computer software (395/183.14)
FOR 269  DF  .~.~.~ Monitor recognizes sequence of events (e.g., protocol or logic state analyzer) (395/183.15)
FOR 270  DF  .~.~ Component dependent technique (395/183.16)
FOR 271  DF  .~.~.~ For reliability enhancing component (e.g., testing backup spare, or fault injection) (395/183.17)
FOR 272  DF  .~.~.~ Memory or storage device component fault (395/183.18)
FOR 273  DF  .~.~.~ Bus, I/O channel, or network path component fault (395/183.19)
FOR 274  DF  .~.~.~ Peripheral device component fault (395/183.2)
FOR 275  DF  .~.~ Output recording (e.g., signature or trace) (395/183.21)
FOR 276  DF  .~.~ Operator interface for diagnosing or testing (395/183.22)
FOR 277  DF  .~ Performance monitoring for fault avoidance (395/184.01)
FOR 278  DF  .~ Error detection or notification (395/185.01)
FOR 279  DF  .~.~ State error (i.e., content of instruction, data, or message) (395/185.02)
FOR 280  DF  .~.~.~ State out of sequence (395/185.03)
FOR 281  DF  .~.~.~.~ Control flow state sequence monitored (e.g., watchdog processor for control-flow checking) (395/185.04)
FOR 282  DF  .~.~.~.~ Error checking code (395/185.05)
FOR 283  DF  .~.~.~ Address error (395/185.06)
FOR 284  DF  .~.~.~ Storage content error (395/185.07)
FOR 285  DF  .~.~ Timing error (e.g., watchdog timer time-out) (395/185.08)
FOR 286  DF  .~.~.~ Bus or I/O channel device fault (395/185.09)
FOR 287  DF  .~.~ Error forwarding and presentation (e.g., operator console, error display) (395/185.1)