US PATENT SUBCLASS 714 / 729
.~.~ Plural scan paths

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724  DF  DIGITAL LOGIC TESTING {10}
726  DF  .~ Scan path testing (e.g., level sensitive scan design (LSSD)) {5}
729.~.~ Plural scan paths

DEFINITION

Classification: 714/729

Plural scan paths:

(under subclass 726) Subject matter having more than one group of shift register latches connected in series, and which groups form a plurality of shift paths (scan paths) along which data can be transmitted.