US PATENT SUBCLASS 714 / FOR 143
.~ Including test pattern generator (371/27.1)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 129  DF  DIGITAL LOGIC TESTING (371/22.1) {10}
FOR 143.~ Including test pattern generator (371/27.1) {6}
FOR 144  DF  .~.~> Random pattern generation (includes pseudorandom pattern) (371/27.2)
FOR 145  DF  .~.~> Having analog signal (371/27.3)
FOR 146  DF  .~.~> Simulation (371/27.4)
FOR 147  DF  .~.~> Testing specific device (371/27.5)
FOR 148  DF  .~.~> Addressing (371/27.6)
FOR 149  DF  .~.~> Clock or synchronization (371/27.7)

DEFINITION

Classification: 714/FOR.143

Including test pattern generator:

Foreign art collections including subject matter in which the specific means or method of generating a test pattern for a digital logic testing system is claimed.