US PATENT SUBCLASS 714 / FOR 147
.~.~ Testing specific device (371/27.5)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 129  DF  DIGITAL LOGIC TESTING (371/22.1) {10}
FOR 143  DF  .~ Including test pattern generator (371/27.1) {6}
FOR 147.~.~ Testing specific device (371/27.5)

DEFINITION

Classification: 714/FOR.147

Testing specific device:

Foreign art collections including subject matter where the test pattern is applied to a distinctive named means to carry out a special function.