US PATENT SUBCLASS 714 / FOR 139
.~ Structural (in-circuit test) (371/22.6)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 129  DF  DIGITAL LOGIC TESTING (371/22.1) {10}
FOR 139.~ Structural (in-circuit test) (371/22.6)

DEFINITION

Classification: 714/FOR.139

Structural (in circuit test):

Foreign art collections including subject matter in which each component of the logic circuit is tested individually while physically connected to the circuit.