US PATENT SUBCLASS 714 / FOR 123
MEMORY TESTING (371/21.1)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 123MEMORY TESTING (371/21.1) {4}
FOR 124  DF  .~> Read-in with read-out and compare (371/21.2) {1}
FOR 126  DF  .~> Electrical parameters (e.g., threshold voltage) (371/21.4)
FOR 127  DF  .~> Performing arithmetic functions on memory contents (371/21.5)
FOR 128  DF  .~> Error mapping or logging (371/21.6)

DEFINITION

Classification: 714/FOR.123

MEMORY TESTING:

Foreign art collections including subject matter in which the

diagnostic testing is performed upon an information signal storage device.