US PATENT SUBCLASS 714 / 731
.~.~ Clock or synchronization


Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724  DF  DIGITAL LOGIC TESTING {10}
726  DF  .~ Scan path testing (e.g., level sensitive scan design (LSSD)) {5}
731.~.~ Clock or synchronization


DEFINITION

Classification: 714/731

Clock or synchronization:

(under subclass 726) Subject matter including a reference timing function or a clock-pulse generator for causing the various parts of the device to operate on a common time base.

SEE OR SEARCH THIS CLASS, SUBCLASS:

744, for clock or synchronization in digital logic testing using a test pattern generator.

SEE OR SEARCH CLASS

326, Electronic Digital Logic Circuitry,

93+, for clocking or synchronization of logic stages or gates.

327, Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems,

141+, for synchronizing electrical nonlinear devices. 713, Electrical Computers and Digital Processing Systems-Support,

400, 503 for synchronization in computer systems.