US PATENT SUBCLASS 714 / 742-- .~.~ Testing specific device

US PATENT SUBCLASS 714 / 742
.~.~ Testing specific device

Current as of: June, 1999
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714 /	HD	ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724	DF	DIGITAL LOGIC TESTING {10}
738	DF	.~ Including test pattern generator {6}
742		.~.~ Testing specific device

DEFINITION

Classification: 714/742

Testing specific device:

(under subclass 738) Subject matter where the test pattern is applied to a distinctive named means to carry out a special function.

(1) Note. Examples of things that are not specific devices include "logic device," "circuit," "device under test," etc.

(2) Note. See sections D and E of the class definition for the distinction between this class and classes having the specific device.

SEE OR SEARCH THIS CLASS, SUBCLASS:

718+, for testing an information signal storage device.