US PATENT SUBCLASS 714 / 738
.~ Including test pattern generator

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724  DF  DIGITAL LOGIC TESTING {10}
738.~ Including test pattern generator {6}
739  DF  .~.~> Random pattern generation (includes pseudorandom pattern)
740  DF  .~.~> Having analog signal
741  DF  .~.~> Simulation
742  DF  .~.~> Testing specific device
743  DF  .~.~> Addressing
744  DF  .~.~> Clock or synchronization

DEFINITION

Classification: 714/738

Including test pattern generator:

(under subclass 724) Subject matter in which the specific means or method of generating a test pattern for a digital logic testing system is claimed.

SEE OR SEARCH CLASS

327, Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems,

100+, for miscellaneous waveform generationor conversion.

345, Selective Visual Display Systems,

26, and 194+ for a character generator in a visual display system with selective electrical control.

708, Electrical Computers and Digital Processing

Systems-Arithmetic Processing and Calculating, 250+, for random number generators, and subclasses 270+ for digital function generators.