US PATENT SUBCLASS 714 / 718
MEMORY TESTING

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

718MEMORY TESTING {4}
719  DF  .~> Read-in with read-out and compare {1}
721  DF  .~> Electrical parameter (e.g., threshold voltage)
722  DF  .~> Performing arithmetic function on memory contents
723  DF  .~> Error mapping or logging

DEFINITION

Classification: 714/718

MEMORY TESTING:

(under the class definition) Subject matter in which the diagnostic testing is performed upon an information signal storage device.

SEE OR SEARCH THIS CLASS, SUBCLASS:

710+, for fault recovery of memory devices.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

210+, for testing of magnetic memory elements, per se.

360, Dynamic Magnetic Information Storage or Retrieval, 26, 47, and 53 for testing of dynamic magnetic memory systems.

365, Static Information Storage and Retrieval,

200, a bad bit memory used to store information; and subclass 201 for specifics of a memory which is tested but doesn't include data processing techniques.

386, Television Signal Processing for Dynamic Recording or Reproducing,

2+, and 47+ for drop-out detection or correction, subclasses 13+ and 85+ for time correction, and subclasses 21+ and 113+ for recorder or reproducer fault condition compensation.