US PATENT SUBCLASS 714 / 719
.~ Read-in with read-out and compare

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

718  DF  MEMORY TESTING {4}
719.~ Read-in with read-out and compare {1}
720  DF  .~.~> Special test pattern (e.g., checkerboard, walking ones)

DEFINITION

Classification: 714/719

Read-in with read-out and compare:

(under subclass 718) Subject matter in which the testing is done by reading in a test pattern, reading out the contents of the memory and comparing the output with the test pattern read in.