US PATENT SUBCLASS 714 / FOR 132
.~.~ Boundary scan (371/22.32)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 129  DF  DIGITAL LOGIC TESTING (371/22.1) {10}
FOR 131  DF  .~ Scan path testing (e.g., level sensitive scan design (LSSD)) (371/22.31) {5}
FOR 132.~.~ Boundary scan (371/22.32)

DEFINITION

Classification: 714/FOR.132

Boundary scan:

Foreign art collections including subject matter where selected components in a circuit are each provided with one or more cells, comprising a single-bit register, coupled to a node of a component, such as an input, output, input/output or control node, and where said cells are serially coupled in a single chain, usually referred to as a boundary-scan chain.