US PATENT SUBCLASS 714 / 30
.~.~.~ Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

1  DF  RELIABILITY AND AVAILABILITY {4}
25  DF  .~ Fault locating (i.e., diagnosis or testing) {7}
27  DF  .~.~ Particular access structure {3}
30.~.~.~ Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path)

DEFINITION

Classification: 714/30

Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path):

(under subclass 27) Subject matter further including means or steps for testing or diagnostic access using specialized testing or diagnosing hardware permanently built into a component of the system being tested or diagnosed.