US PATENT SUBCLASS 714 / FOR 138
.~ Built-in testing circuit (BILBO) (371/22.5)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 129  DF  DIGITAL LOGIC TESTING (371/22.1) {10}
FOR 138.~ Built-in testing circuit (BILBO) (371/22.5)

DEFINITION

Classification: 714/FOR.138

Built-in test circuit (BILBO):

Foreign art collections including subject matter in which the digital logic testing equipment includes a selectively configurable shift register, structurally a part of the device being tested.