(under subclass 724) Subject matter for testing an array of logical elements selectively configurable to sequentially
perform various binary logic functions.
(1) Note. Examples of such binary logic functions are AND, OR, NAND, NOR, and NOT.
SEE OR SEARCH CLASS
324, Electricity: Measuring and Testing, appropriate subclass, particularly
73.1, for measuring and testing of electrical device parameters under controlled conditions.
326, Electronic Digital Logic Circuitry,
16, for electronic digital logic circuitry with test facilitating feature, subclasses 21+ for electronic digital logic circuitry maintaining signal integrity, and subclasses 37+ for a programmable or multifunctional logic array circuit, per se.
