US PATENT SUBCLASS 714 / FOR 124
.~ Read-in with read-out and compare (371/21.2)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 123  DF  MEMORY TESTING (371/21.1) {4}
FOR 124.~ Read-in with read-out and compare (371/21.2) {1}
FOR 125  DF  .~.~> Special test patterns (e.g., checkerboard, walking ones) (371/21.3)

DEFINITION

Classification: 714/FOR.124

Read-in with read-out and compare:

Foreign art collections including subject matter in which the testing is done by reading in a test pattern, reading out the contents of the memory and comparing the output with the test pattern read in.