US PATENT SUBCLASS 714 / FOR 260
.~.~.~ Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path) (395/183.06)


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 231  DF  RELIABILITY AND AVAILABILITY (395/180) {4}
FOR 255  DF  .~ Fault locating (i.e., diagnosis or testing) (395/183.01) {7}
FOR 257  DF  .~.~ With particular access structure (395/183.03) {3}
FOR 260.~.~.~ Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path) (395/183.06)


DEFINITION

Classification: 714/FOR.260

Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path):

Foreign art collections including subject matter further including means or steps for testing or diagnostic access using specialized testing or diagnosing hardware permanently built into a component of the system being tested or diagnosed.