US PATENT SUBCLASS 714 / FOR 260
.~.~.~ Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path) (395/183.06)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 231  DF  RELIABILITY AND AVAILABILITY (395/180) {4}
FOR 255  DF  .~ Fault locating (i.e., diagnosis or testing) (395/183.01) {7}
FOR 257  DF  .~.~ With particular access structure (395/183.03) {3}
FOR 260.~.~.~ Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path) (395/183.06)

DEFINITION

Classification: 714/FOR.260

Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path):

Foreign art collections including subject matter further including means or steps for testing or diagnostic access using specialized testing or diagnosing hardware permanently built into a component of the system being tested or diagnosed.