US PATENT SUBCLASS 714 / FOR 257
.~.~ With particular access structure (395/183.03)


Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 231  DF  RELIABILITY AND AVAILABILITY (395/180) {4}
FOR 255  DF  .~ Fault locating (i.e., diagnosis or testing) (395/183.01) {7}
FOR 257.~.~ With particular access structure (395/183.03) {3}
FOR 258  DF  .~.~.~> Substituted emulative component (e.g., emulator microprocessor) (395/183.04) {1}
FOR 260  DF  .~.~.~> Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path) (395/183.06)
FOR 261  DF  .~.~.~> Additional processor for in-system fault locating (e.g., distributed diagnosis program) (395/183.07)


DEFINITION

Classification: 714/FOR.257

With particular access structure:

Foreign art collections including subject matter further including means or steps related to an access structure specialized for observing or controlling a test or diagnosis.