US PATENT SUBCLASS 714 / 727
.~.~ Boundary scan


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724  DF  DIGITAL LOGIC TESTING {10}
726  DF  .~ Scan path testing (e.g., level sensitive scan design (LSSD)) {5}
727.~.~ Boundary scan


DEFINITION

Classification: 714/727

Boundary scan:

(under subclass 726) Subject matter where selected components in a circuit are each provided with one or more cells, comprising a single-bit register, coupled to a node of a component, such as an input, output, input/output or control node, and where said cells are serially coupled in a single chain, usually referred to as a boundary-scan chain.