US PATENT SUBCLASS 714 / 36
.~.~.~ Test sequence at power-up or initialization

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

1  DF  RELIABILITY AND AVAILABILITY {4}
25  DF  .~ Fault locating (i.e., diagnosis or testing) {7}
32  DF  .~.~ Particular stimulus creation {4}
36.~.~.~ Test sequence at power-up or initialization

DEFINITION

Classification: 714/36

Test sequence at power-up or initialization:

(under subclass 32) Subject matter further including means or steps for performing a sequence of tests automatically in response to a power-up or initialization action.

SEE OR SEARCH CLASS

710, Electrical Computers and Digital Processing Systems-Input/Output, appropriate subclasses, for assigning operating characteristics to peripherals, particularly

104, for utilizing a hardware structure for providing a processor with an arrangement of the digital data processing system including characteristics of the digital data processing system's components.

711, Electrical Computers and Digital Processing Systems: Memory,

170, for automatically determining and allocating memory space or specifying an allocation.

713, Electrical Computers and Digital Processing Systems-Support,

1, 100, for digital data processing system initialization and configuration at boot-time.