US PATENT SUBCLASS 714 / FOR 263
.~.~.~ Derived from analysis (e.g., of a specification or by simulation) (395/183.09)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 231  DF  RELIABILITY AND AVAILABILITY (395/180) {4}
FOR 255  DF  .~ Fault locating (i.e., diagnosis or testing) (395/183.01) {7}
FOR 262  DF  .~.~ With particular stimulus creation (395/183.08) {4}
FOR 263.~.~.~ Derived from analysis (e.g., of a specification or by simulation) (395/183.09)

DEFINITION

Classification: 714/FOR.263

Derived from analysis (e.g., of a specification or by simulation):

Foreign art collections including subject matter further including means or steps for deriving a test or diagnosis program based on an analysis of specification, design, or output of the system to be tested or diagnosed.