US PATENT SUBCLASS 714 / 734-- .~ Structural (in-circuit test)

US PATENT SUBCLASS 714 / 734
.~ Structural (in-circuit test)

Current as of: June, 1999
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714 /	HD	ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724	DF	DIGITAL LOGIC TESTING {10}
734		.~ Structural (in-circuit test)

DEFINITION

Classification: 714/734

Structural (in-circuit test):

(under subclass 724) Subject matter in which each component of the logic circuit is tested individually while physically connected to the circuit.

(1) Note. Generally, the test instrument is connected to nodes of the logic circuit under test in a unique way for each component.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing, appropriate subclass, particularly

73.1, for measuring and testing of electrical device parameters (other than by information signal content) under controlled conditions.