US PATENT SUBCLASS 714 / 33
.~.~.~ Derived from analysis (e.g., of a specification or by stimulation)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

1  DF  RELIABILITY AND AVAILABILITY {4}
25  DF  .~ Fault locating (i.e., diagnosis or testing) {7}
32  DF  .~.~ Particular stimulus creation {4}
33.~.~.~ Derived from analysis (e.g., of a specification or by stimulation)

DEFINITION

Classification: 714/33

Derived from analysis (e.g., of a specification or by simulation):

(under subclass 32) Subject matter further including means or steps for deriving a test or diagnosis program based on an

analysis of specification, design, or output of the system to be tested or diagnosed.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

73.1, for various electrical testing arrangements that may include fault locating.

395, Information Processing System Organization,

500.02+, for circuit design and subclasses 500.34+ for simulating electronic device and electrical system.